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Fundamental Principles of Engineering Nanometrology

Fundamental Principles of Engineering Nanometrology

of: Richard Leach

Elsevier Reference Monographs, 2009

ISBN: 9781437778328 , 352 Pages

Format: PDF, ePUB

Copy protection: DRM

Windows PC,Mac OSX geeignet für alle DRM-fähigen eReader Apple iPad, Android Tablet PC's Apple iPod touch, iPhone und Android Smartphones

Price: 124,00 EUR



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