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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Springer-Verlag, 2013
Format: PDF, Read online
Computational Methods in Transport: Verification and Validation
Springer-Verlag, 2008
Format: PDF, Read online
Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials
Springer-Verlag, 2010
Format: PDF, Read online
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